Yulei Jin, Feng Zhou, Member, IEEE, Weizong Xu, Zhengpeng Wang, Tianyang Zhou, Dong Zhou, Fangfang Re, Yuanyang Xia, Leke Wu, Yiheng Li, Tinggang Zhu, Dunjun Chen, Rong Zhang, Jiandong Ye, Youdou Zheng and Hai Lu, Senior Member, IEEE
Sheng Li a, Chi Zhang a, Siyang Liu a, Jiaxing Wei a, Long Zhang a, Weifeng Sun a,*,
Youhua Zhu b, Tingting Zhang c, Dongsheng Wang c, Yinxia Sun c
a National ASIC System Engineering Research Center, School of Electronic Science and Engineering, Southeast University, Nanjing, 210096, China
b School of Electronics and Information, Nantong University, Nantong, 226019, China
c CorEnergy Semiconductor Co., LTD, Zhangjiagang, 215600, China
Sheng Li, Siyang Liu, Chi Zhang, Jiaxing Wei, Long Zhang, Weifeng Sun* National ASIC System Engineering Research Center Southeast University Nanjing, China
Youhua Zhu, Tingting Zhang, Dongsheng Wang, Yinxia Sun, Yiheng Li, Tinggang Zhu CorEnergy Semiconductor Co., LTD Zhangjiagang, China
To cite this article: Changkun Zeng et al 2019 Appl. Phys. Express 12 121005
To cite this article: Yuanyang Xia et al 2020 Mater. Res. Express 7 065902
Changkun Zeng,Weizong Xu,Yuanyang Xia,Danfeng Pan,Yiwang Wang,Qiang Wang,Youhua Zhu,Fangfang Ren,Dong ZHou,Jiandong Ye,Dunjun Chen,Rong Zhang,Youdou Zheng,and Hai Lu
2019 The Japan Society of Applied Physics
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